Clarifying the Role of Ferroelectric in Expanding the Memory Window of Ferroelectric FETs with Gate-Side Injection: Isolating Contributions from Polarization and Charge Trapping

In this work, we performed a comprehensive experimental and modeling study, clarifying the role of ferroelectric materials in boosting the memory window of FeFETs with gate-side charge injection for the first time. We separated the ferroelectric contributions to the memory window into remnant polarization and top charge trap layer (CTL) trapping. Our findings demonstrate that: (i) Ferroelectric materials enhance the memory window in two ways: by switched more polarization when CTL traps more, which provides screening charges, and through their super-linear Q-V relationship that boosts the CTL electric field and enhances charge trapping; (ii) The contributions from polarization and CTL trapping mutually reinforce each other, resulting in a larger memory window compared to a ferroelectric + dielectric stack or a high-ț + &7/ VWDFN, where only one factor is active; (iii) Combined experimental data and TCAD simulations confirm that approximately one-third of the memory window is due to increased polarization, while two-thirds result from CTL trapping; (iv) The memory window can be further enhanced with a blocking oxide on top of the CTL, achieving up to a 16V window with an ONO blocking oxide.