Abstract
Molecular dynamics simulations of repetitive bombardment of solids by keV cluster beams have generated so much data that easy interpretations are not possible. Moreover, although the MD simulations remove 3-4 nm of material, that is not sufficient material to determine a depth profile. The recently developed steady-state statistical sputtering model (SS-SSM) uses information from the MD simulations and incorporates it into a set of differential equations to predict a depth profile. In this study the distributions that provide the input to the SS-SSM are compared for simulations of 15 keV bombardment of Ag(111) by C 60, Au3 and Ar872 cluster beams.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 196-199 |
| Number of pages | 4 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
| Volume | 303 |
| DOIs | |
| State | Published - 2013 |
All Science Journal Classification (ASJC) codes
- Nuclear and High Energy Physics
- Instrumentation
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