Comparative analysis of NBTI effects on low power and high performance flip-flops

K. Ramakrishnan; X. Wu; N. Vijaykrishnan; Y. Xie

doi:10.1109/ICCD.2008.4751862

Comparative analysis of NBTI effects on low power and high performance flip-flops

K. Ramakrishnan, X. Wu, N. Vijaykrishnan, Y. Xie

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

20 Scopus citations

Abstract

Mitigating the circuit aging effect in digital circuits has become a very important concern for current and future technology nodes. Negative Bias Temperature Instability (NBTI) is one of the most important circuit aging mechanisms, which can incur timing errors. Flip-flops play a vital role as storage elements in pipelined architectures and are prone to effects of aging. NBTI increases the transistor threshold voltage, affecting the performance of the chip. In this paper, we study the effects of NBTI on the timing characteristics of different types of low power and high performance flip-flops. Factors such as input data probability and temperature which affect the degradation rate are also analyzed.

Original language	English (US)
Title of host publication	26th IEEE International Conference on Computer Design 2008, ICCD
Pages	200-205
Number of pages	6
DOIs	https://doi.org/10.1109/ICCD.2008.4751862
State	Published - 2008
Event	26th IEEE International Conference on Computer Design 2008, ICCD - Lake Tahoe, CA, United States Duration: Oct 12 2008 → Oct 15 2008

Publication series

Name	26th IEEE International Conference on Computer Design 2008, ICCD

Other

Other	26th IEEE International Conference on Computer Design 2008, ICCD
Country/Territory	United States
City	Lake Tahoe, CA
Period	10/12/08 → 10/15/08

All Science Journal Classification (ASJC) codes

Hardware and Architecture
Electrical and Electronic Engineering

Access to Document

10.1109/ICCD.2008.4751862

Cite this

@inproceedings{840b28d4599d4a2297056c06e26d9885,

title = "Comparative analysis of NBTI effects on low power and high performance flip-flops",

abstract = "Mitigating the circuit aging effect in digital circuits has become a very important concern for current and future technology nodes. Negative Bias Temperature Instability (NBTI) is one of the most important circuit aging mechanisms, which can incur timing errors. Flip-flops play a vital role as storage elements in pipelined architectures and are prone to effects of aging. NBTI increases the transistor threshold voltage, affecting the performance of the chip. In this paper, we study the effects of NBTI on the timing characteristics of different types of low power and high performance flip-flops. Factors such as input data probability and temperature which affect the degradation rate are also analyzed.",

author = "K. Ramakrishnan and X. Wu and N. Vijaykrishnan and Y. Xie",

year = "2008",

doi = "10.1109/ICCD.2008.4751862",

language = "English (US)",

isbn = "9781424426584",

series = "26th IEEE International Conference on Computer Design 2008, ICCD",

pages = "200--205",

booktitle = "26th IEEE International Conference on Computer Design 2008, ICCD",

note = "26th IEEE International Conference on Computer Design 2008, ICCD ; Conference date: 12-10-2008 Through 15-10-2008",

}

Ramakrishnan, K, Wu, X, Vijaykrishnan, N & Xie, Y 2008, Comparative analysis of NBTI effects on low power and high performance flip-flops. in 26th IEEE International Conference on Computer Design 2008, ICCD., 4751862, 26th IEEE International Conference on Computer Design 2008, ICCD, pp. 200-205, 26th IEEE International Conference on Computer Design 2008, ICCD, Lake Tahoe, CA, United States, 10/12/08. https://doi.org/10.1109/ICCD.2008.4751862

Comparative analysis of NBTI effects on low power and high performance flip-flops. / Ramakrishnan, K.; Wu, X.; Vijaykrishnan, N. et al.
26th IEEE International Conference on Computer Design 2008, ICCD. 2008. p. 200-205 4751862 (26th IEEE International Conference on Computer Design 2008, ICCD).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Comparative analysis of NBTI effects on low power and high performance flip-flops

AU - Ramakrishnan, K.

AU - Wu, X.

AU - Vijaykrishnan, N.

AU - Xie, Y.

PY - 2008

Y1 - 2008

N2 - Mitigating the circuit aging effect in digital circuits has become a very important concern for current and future technology nodes. Negative Bias Temperature Instability (NBTI) is one of the most important circuit aging mechanisms, which can incur timing errors. Flip-flops play a vital role as storage elements in pipelined architectures and are prone to effects of aging. NBTI increases the transistor threshold voltage, affecting the performance of the chip. In this paper, we study the effects of NBTI on the timing characteristics of different types of low power and high performance flip-flops. Factors such as input data probability and temperature which affect the degradation rate are also analyzed.

AB - Mitigating the circuit aging effect in digital circuits has become a very important concern for current and future technology nodes. Negative Bias Temperature Instability (NBTI) is one of the most important circuit aging mechanisms, which can incur timing errors. Flip-flops play a vital role as storage elements in pipelined architectures and are prone to effects of aging. NBTI increases the transistor threshold voltage, affecting the performance of the chip. In this paper, we study the effects of NBTI on the timing characteristics of different types of low power and high performance flip-flops. Factors such as input data probability and temperature which affect the degradation rate are also analyzed.

UR - http://www.scopus.com/inward/record.url?scp=62349126857&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=62349126857&partnerID=8YFLogxK

U2 - 10.1109/ICCD.2008.4751862

DO - 10.1109/ICCD.2008.4751862

M3 - Conference contribution

AN - SCOPUS:62349126857

SN - 9781424426584

T3 - 26th IEEE International Conference on Computer Design 2008, ICCD

SP - 200

EP - 205

BT - 26th IEEE International Conference on Computer Design 2008, ICCD

T2 - 26th IEEE International Conference on Computer Design 2008, ICCD

Y2 - 12 October 2008 through 15 October 2008

ER -

Comparative analysis of NBTI effects on low power and high performance flip-flops

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