Comparative area and parasitics analysis in FinFET and heterojunction vertical TFET standard cells

Moon Seok Kim, William Cane-Wissing, Xueqing Li, Jack Sampson, Suman Datta, Sumeet Kumar Gupta, Vijaykrishnan Narayanan

Research output: Contribution to journalArticlepeer-review

26 Scopus citations


Vertical tunnel field-effect transistors (VTFETs) have been extensively explored to overcome the scaling limits and to improve on-current (ION) compared to standard lateral device structures for the future technologies. The benefits in terms of reduced footprint, high ION and feasibility of fabrication have been demonstrated in several works. Among various VTFETs, the asymmetric heterojunction vertical tunnel FETs (HVTFETs) have emerged as one of the promising alternatives to standard transistors for low-voltage applications. However, while such device-level benefits without parasitics have been widely investigated, logic-gate design with parasitics and layout implications are not clear. In this article, we investigate and compare the layouts and parasitic capacitances and resistances of HVTFETs with FinFETs. Due to the vertical device structure of HVTFETs, a smaller footprint is observed compared to FinFETs in cells with small fan-in. However, for high fan-in cells, HVTFETs exhibit area overheads due to infeasibility of contact sharing in parallel and series transistors. These area overheads also lead to approximately 48% higher parasitic capacitance and resistance compared to FinFETs when the number of parallel and series connections increases. Further, in order to analyze the impact of parasitics, we modeled the analytical parasitics in SPICE. The models for both HVTFETs and FinFETs with parasitics were used to simulate a 15-stage inverter-based ring oscillator (RO) in order to compare the delay and energy. Our simulation results clearly show that HVTFETs exhibit less delay at a VDD < 0.45 V and higher energy efficiency for VDDs in the range of 0.3V-0.7V, albeit at the cost of 8% performance degradation.

Original languageEnglish (US)
Article number38
JournalACM Journal on Emerging Technologies in Computing Systems
Issue number4
StatePublished - May 2016

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering


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