Engineering & Materials Science
Ion beams
69%
Oxide films
60%
Vanadium
60%
Infrared imaging
58%
Thin films
46%
Magnetron sputtering
18%
Infrared radiation
18%
Sputtering
17%
Integrated circuits
12%
Detectors
10%
Nanocrystals
10%
Focal plane arrays
9%
Raman spectroscopy
9%
Atomic force microscopy
8%
Photons
8%
Electric properties
7%
Transmission electron microscopy
7%
X ray diffraction
6%
MEMS
6%
Oxides
6%
Cameras
4%
Substrates
4%
Microstructure
4%
Chemical analysis
4%
Temperature
2%
Mathematics
Oxides
67%
Thin Films
61%
Magnetron Sputtering
31%
Sputtering
25%
Integrated Circuits
20%
Detector
16%
Infrared Focal Plane Array
15%
Night Vision
14%
Infrared Radiation
13%
Raman Spectroscopy
13%
Atomic Force Microscopy
13%
Nanocrystals
13%
Transmission Electron Microscopy
12%
Electrical Properties
11%
X-ray Diffraction
11%
Micro-electro-mechanical Systems
10%
Resistivity
9%
Infrared
9%
Military
9%
Photon
9%
Camera
8%
Substrate
8%
Microstructure
8%
Spacing
7%
Resistance
7%
Compatibility
7%
Incidence
6%
Biased
6%
Standards
3%
Coefficient
3%
Form
2%
Microbolometer
1%
Physics & Astronomy
vanadium oxides
65%
ion beams
38%
thin films
25%
integrated circuits
13%
magnetron sputtering
11%
sputtering
10%
night vision
10%
focal plane devices
8%
infrared radiation
8%
detectors
7%
grazing incidence
7%
compatibility
6%
microelectromechanical systems
6%
low noise
6%
nanocrystals
6%
Raman spectroscopy
5%
cameras
5%
direct current
5%
spacing
5%
atomic force microscopy
5%
electrical properties
5%
electrical resistivity
4%
microstructure
4%
sensitivity
4%
photons
3%
matrices
3%
coefficients
3%
diffraction
3%
x rays
3%
temperature
2%
Chemical Compounds
Infrared Imaging
72%
Vanadium Oxide
57%
Ion Beam
54%
Liquid Film
23%
Ion Beam Sputtering
22%
Magnetron Sputtering
16%
Photon
6%
Electrical Property
5%
Nanocrystal
5%
Atomic Force Microscopy
5%
Amorphous Material
4%
Microstructure
4%
Transmission Electron Microscopy
4%
Resistance
4%
X-Ray Diffraction
3%