@inproceedings{73809221f11145bfba4f920f229a84b4,
title = "Comparison of reversal and multiprobe error separation",
abstract = "This paper presents a comparison of two well-known methods for separating spindle error motion from artifact roundness. This work is significant because it documents an effort to characterize a particular spindle design with less than five nanometers radial error, a figure so small that extensive verification is warranted. To this end, two distinct types of error separation methods, reversal and multiprobe, were applied using two different sets of test hardware allowing direct comparison of results using the four combinations of hardware and separation algorithm. The results show that sub-nanometer features in both spindle error and artifact form are reliably and repeatably resolved by both techniques.",
author = "Marsh, {E. R.} and Arneson, {D. A.} and Martin, {D. L.}",
year = "2008",
month = jan,
day = "1",
language = "English (US)",
series = "Proceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008",
publisher = "euspen",
pages = "389--393",
editor = "{Van Brussel}, Hendrik and H. Spaan and E. Brinksmeier and T. Burke",
booktitle = "Proceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008",
note = "10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008 ; Conference date: 18-05-2008 Through 22-05-2008",
}