TY - GEN
T1 - Comparison of S-parameter concatenation to full-wave simulation for high-speed interconnect analysis
AU - Balasubramanian, Vittal
AU - Smith, Stephen B.
AU - Agili, Sedig S.
PY - 2007
Y1 - 2007
N2 - A standard method of high-speed digital channel simulation involves dividing the channel into discrete parts and analyzing each part independently to determine its individual S-parameters. These S-parameters are then combined or concatenated to determine the overall channel performance. Analyzed here is a portion of such a channel composed of a high-speed connector and it's footprint on a printed circuit board. For this structure, the paper compares the concatenation method to a single full-wave simulation of the entire structure. The first method is evaluated to determine its upper frequency limit thus showing when it is appropriate to use it over full-wave analysis, which is typically more complex and time consuming. Additionally, some structures that are not accounted for when using the concatenation method are investigated.
AB - A standard method of high-speed digital channel simulation involves dividing the channel into discrete parts and analyzing each part independently to determine its individual S-parameters. These S-parameters are then combined or concatenated to determine the overall channel performance. Analyzed here is a portion of such a channel composed of a high-speed connector and it's footprint on a printed circuit board. For this structure, the paper compares the concatenation method to a single full-wave simulation of the entire structure. The first method is evaluated to determine its upper frequency limit thus showing when it is appropriate to use it over full-wave analysis, which is typically more complex and time consuming. Additionally, some structures that are not accounted for when using the concatenation method are investigated.
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M3 - Conference contribution
AN - SCOPUS:84866393722
SN - 9781604237900
T3 - International Engineering Consortium - DesignCon 2007
SP - 1629
EP - 1643
BT - International Engineering Consortium - DesignCon 2007
T2 - DesignCon 2007
Y2 - 29 January 2007 through 1 February 2007
ER -