Comparison of the MOCVD growth and properties of wafer-scale transition metal dichalcogenide epitaxial monolayers

Tanushree H. Choudhury, Nicholas Trainor, Chen Chen, Mikhail Chubarov, Saiphaneendra Bachu, Kasra Momeni, James Spencer Lundh, Danielle Reifsnyder Hickey, Tianyi Zhang, Amritanand Sebastian, Haoyue Zhu, Baokun Song, Yueli Chen, Benjamin Huet, Anushka Bansal, Sukwon Choi, Nasim Alem, Mauricio Terrones, Deep Jariwala, Saptarshi DasJoan M. Redwing

Research output: Contribution to journalArticlepeer-review

Abstract

Epitaxial growth of transition metal dichalcogenides (TMDs) by metalorganic chemical vapor deposition is a promising method for wafer-scale synthesis of monolayer films. This study focuses on a comparison of the epitaxial growth of MoS2, WS2, and WSe2 monolayers on 2 inch c-plane sapphire substrates using a cold-wall reactor with metal hexacarbonyl and hydride chalcogen sources. Uniform thermofluidic conditions enabled a comparative analysis of nucleation density, domain size, and lateral growth rate across TMD compounds, shedding light on the impact of TMD chemistry on epitaxial growth. Despite the use of chemically analogous precursors such as Mo(CO)6 or W(CO)6 and H2S or H2Se, significant differences in growth behavior are observed. Comprehensive structural, optical, and transport characterizations provide insights into sulfur versus selenium-based TMDs, advancing the understanding of optimized growth conditions for these emerging materials.

Original languageEnglish (US)
Article number045009
Journal2D Materials
Volume12
Issue number4
DOIs
StatePublished - Oct 1 2025

All Science Journal Classification (ASJC) codes

  • General Chemistry
  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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