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Computational Screening and Multiscale Simulation of Barrier-Free Contacts for 2D Semiconductor pFETs

  • Ning Yang
  • , Yuxuan Cosmi Lin
  • , Chih Piao Chuu
  • , Saifur Rahman
  • , Tong Wu
  • , Ang Sheng Chou
  • , San Lin Liew
  • , Kohei Fujiwara
  • , Hung Yu Chen
  • , Junya Ikeda
  • , Atsushi Tsukazaki
  • , Duen Huei Hou
  • , Wei Yen Woon
  • , Szuya Liao
  • , Shengxi Huang
  • , Xiaofeng Qian
  • , Jing Guo
  • , Iuliana Radu
  • , H. S. Philip Wong
  • , Han Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Low-resistance p-type contacts to two-dimensional (2D) semiconductors remains a critical challenge towards the industrial application of 2D channel materials in advanced logic technology. To address this challenge, we computationally screen and identify designs for ultralow-resistance p-type contacts to 2D semiconductors such as WSe2 by combining ab initio density-functional-theory (DFT) and quantum device simulations. Two new contact strategies, van der Waals metallic contact (such as 1H-NbS2), and bulk semimetallic contact (such as Co3 Sn2 S2), are identified as realistic pathways to achieving Schottky-barrier-free and low-contact-resistance p-type contacts for 2D semiconductor pFETs. Simulations of these new strategies suggest reduced metal-induced gap states, negligible Schottky barrier height and small contact resistance (down to 20 Ω·μm). Preliminary experimental results in developing Co3 Sn2 S2 as a new semimetal contact material are also demonstrated.

Original languageEnglish (US)
Title of host publication2022 International Electron Devices Meeting, IEDM 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2811-2814
Number of pages4
ISBN (Electronic)9781665489591
DOIs
StatePublished - 2022
Event2022 International Electron Devices Meeting, IEDM 2022 - San Francisco, United States
Duration: Dec 3 2022Dec 7 2022

Publication series

NameTechnical Digest - International Electron Devices Meeting, IEDM
Volume2022-December
ISSN (Print)0163-1918

Conference

Conference2022 International Electron Devices Meeting, IEDM 2022
Country/TerritoryUnited States
CitySan Francisco
Period12/3/2212/7/22

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Materials Chemistry
  • Electrical and Electronic Engineering

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