Abstract
The blueshift of the optical absorption edge along with the intense red photoluminescence (PL) peak from micron-long crystalline silicon nanowires (SiNW) prepared by pulsed-laser vaporization of heated Si targets were analyzed. A Perkin-Elmer Lambda 40 spectrophotometer was used to perform optical absorption of the SiNWs samples deposited on a fused quartz plate. It was observed that from the fit of optical absorption there is an upshift of band edge and the shift is different for indirect and direct bands of SiNWs. It was found that the shape of the band and PL peak strongly depends on the diameter distribution.
Original language | English (US) |
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Pages (from-to) | 2008-2010 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 85 |
Issue number | 11 |
DOIs | |
State | Published - Sep 13 2004 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)