Abstract
Continuous single crystal (001)PbTiO3 (PT) thin films, 5 to 300 nm in thickness, were epitaxially grown on miscut (001)SrTiO3 (ST), miscut angle 1.7 degree, by rf-planar magnetron sputtering. The surface of the miscut substrates comprised periodic striped patterns with periodic step lines and terraces; the step height was 0.4 nm and terrace width was 14 nm. The surface of PT thin films also comprised periodic striped patterns; the step height was 1 to 3 nm and the terrace width was 50 to 150 nm. The film growth was governed by a step-flow growth with step-bunching. The layer growth mode of Frank-van der Merwe type was predominant and the surface was extremely flat on an atomic scale. The resultant epitaxial films showed a single crystal/single c-domain structure. Epitaxial growth on miscut substrate is essential to fabricate perovskite thin films with controlled microstructure.
| Original language | English (US) |
|---|---|
| Pages (from-to) | S1344-S1348 |
| Journal | Journal of the Korean Physical Society |
| Volume | 32 |
| Issue number | 4 SUPPL. |
| State | Published - 1998 |
All Science Journal Classification (ASJC) codes
- General Physics and Astronomy