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Contrast mechanism of ultrasonic atomic force microscopy
Weilou Gao
, Bernhard R. Tittmann
, Chiaki Miyasaka
Engineering Science and Mechanics
Materials Research Institute (MRI)
Research output
:
Contribution to journal
›
Conference article
›
peer-review
7
Scopus citations
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Keyphrases
Ultrasonic Atomic Force Microscopy
100%
Experiment Results
100%
Contrast Mechanism
100%
High Contrast
50%
Elastic Properties
50%
Finite Element Method
50%
Resonant Frequency
50%
Numerical Simulation
50%
Atomic Force Microscope
50%
Silicon Nitride
50%
Simulation-based
50%
Dependant
50%
Phase Image
50%
Diffusion Bonded
50%
Engineering
Atomic Force Microscopy
100%
Ultrasonics
100%
Experimental Finding
50%
Atomic Force Microscope
50%
Phase Image
50%
Finite Element Analysis
50%
Resonant Frequency
50%
Material Science
Atomic Force Microscopy
100%
Elastic Property
50%
Finite Element Method
50%
Elasticity
50%
Silicon Nitride
50%
Physics
Ultrasonics
100%
Atomic Force Microscopy
100%
Resonant Frequency
50%
Finite Element Analysis
50%