Correcting measured CPT tip resistance for multiple thin-layer effects

K. M. Yost, J. Cooper, R. A. Green, E. R. Martin, A. Yerro

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Multiple interbedded fine-grained layers in a sand deposit have a “smoothing” effect on the measured tip resistance (qc) from the cone penetrometer test (CPT). This can result in an underestimation of the predicted liquefaction resistance of the sand layers. Herein, the efficacies of two multiple-thin-layer correction procedures are evaluated using published calibration chamber test data. The results highlight limitations of the assessed procedures for profiles with layers less than 40 mm thick. A new approach to estimate the “true” qc (i.e., values that would be measured in a stratum absent of multiple thin-layer effects) from measured qc is explored. The proposed numerical optimization algorithm searches for “true” soil profiles with a finite number of layers. We compare two versions of the algorithm that numerically optimize different functions, one of which uses a logarithm to refine fine-scale details, but which requires longer calculation times to yield improved corrected qc profiles.

Original languageEnglish (US)
Title of host publicationCone Penetration Testing 2022 - Proceedings of the 5th International Symposium on Cone Penetration Testing, CPT 2022
EditorsGuido Gottardi, Laura Tonni
PublisherCRC Press/Balkema
Pages778-783
Number of pages6
ISBN (Print)9781032312590
DOIs
StatePublished - 2022
Event5th International Symposium on Cone Penetration Testing, CPT 2022 - Bologna, Italy
Duration: Jun 8 2022Jun 10 2022

Publication series

NameCone Penetration Testing 2022 - Proceedings of the 5th International Symposium on Cone Penetration Testing, CPT 2022

Conference

Conference5th International Symposium on Cone Penetration Testing, CPT 2022
Country/TerritoryItaly
CityBologna
Period6/8/226/10/22

All Science Journal Classification (ASJC) codes

  • General Materials Science

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