Abstract
In the original version of this article, funding for A.D.G. from NSF EEC 2244201 was omitted. This correction does not alter the major conclusions of this work.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 5730 |
| Number of pages | 1 |
| Journal | ACS Applied Electronic Materials |
| Volume | 7 |
| Issue number | 12 |
| DOIs |
|
| State | Published - Jun 24 2025 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Materials Chemistry
- Electrochemistry
Fingerprint
Dive into the research topics of 'Correction to: Effects of Sb and Bi Doping in SnTe Layers Grown by Molecular Beam Epitaxy (ACS Appl. Electron. Mater. (2025) 7:8 (3543−3551) DOI: 10.1021/acsaelm.5c00299)'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver