Correlating deformation mechanisms with mechanical properties in freestanding thin metallic films

M. A. Haque; M. T.A. Saif; J. S. Robach; I. M. Robertson

doi:10.1017/s1431927603444498

Correlating deformation mechanisms with mechanical properties in freestanding thin metallic films

M. A. Haque, M. T.A. Saif, J. S. Robach, I. M. Robertson

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	898-899
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	9
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/s1431927603444498
State	Published - 2003

All Science Journal Classification (ASJC) codes

Instrumentation

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title = "Correlating deformation mechanisms with mechanical properties in freestanding thin metallic films",

author = "Haque, {M. A.} and Saif, {M. T.A.} and Robach, {J. S.} and Robertson, {I. M.}",

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language = "English (US)",

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pages = "898--899",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

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AU - Haque, M. A.

AU - Saif, M. T.A.

AU - Robach, J. S.

AU - Robertson, I. M.

PY - 2003

Y1 - 2003

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DO - 10.1017/s1431927603444498

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SN - 1431-9276

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SP - 898

EP - 899

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Correlating deformation mechanisms with mechanical properties in freestanding thin metallic films

All Science Journal Classification (ASJC) codes

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