Abstract
The influence of domain switching on the evolution of macroscopic polarization in the ferroelectric Pb (Mg13 Nb23) 1-x Tix O3 material was studied. Domain switching during the application of a compressive stress was evaluated using in situ x-ray diffraction. It was found that stress depolarization was controlled by 90° domain reorientation. Details on domain switching quantification were given for samples with their surface parallel to the polar axis. From x-ray data, the macroscopic polarization versus stress was also simulated, underlying a strong correlation between microscopic parameters and macroscopic properties. This simulation was based on the assumption that the dipolar moment of the unit cell does not change with stress. The x-ray diffraction was established as a viable nondestructive technique for the determination of remnant polarization.
Original language | English (US) |
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Article number | 074104 |
Journal | Journal of Applied Physics |
Volume | 100 |
Issue number | 7 |
DOIs | |
State | Published - 2006 |
All Science Journal Classification (ASJC) codes
- General Physics and Astronomy