TY - JOUR
T1 - Correlations between free volume and pile-up behavior in nanoindentation reference glasses
AU - Howell, J. A.
AU - Hellmann, J. R.
AU - Muhlstein, C. L.
N1 - Funding Information:
The authors acknowledge the support of the NSF Industry-University Center for Glass Research, Site for Glass Surfaces and Interfaces Research at the Pennsylvania State University to JRH, the National Science Foundation (NSF CMS-0528234 to CLM and graduate research fellowship to JAH). The authors also appreciate the ongoing discussions with Drs. David Green and Carlo Pantano about this research.
PY - 2008/5/15
Y1 - 2008/5/15
N2 - Reliable interpretation of nanoindentation data often requires that corrections be made for geometric effects such as material pile-up. These corrections are often made with the assumption that the reference glasses used to calibrate the instrument are not susceptible to such effects. This letter presents the pile-up behavior of four silicate reference glasses, (a proprietary fused silica supplied by Hysitron, Inc., Corning 1737f, Corning 2947 (soda-lime-silica), and Schott BK-7, respectively), and correlates their tendency to pile-up with the free volume of their network structures. Irrespective of the reference glass that is used, shallow penetration depths (i.e., < 150nm) should be corrected for the errors induced by pile-up in the reference glass to avoid anomalous trends in modulus and hardness during nanoindentation studies.
AB - Reliable interpretation of nanoindentation data often requires that corrections be made for geometric effects such as material pile-up. These corrections are often made with the assumption that the reference glasses used to calibrate the instrument are not susceptible to such effects. This letter presents the pile-up behavior of four silicate reference glasses, (a proprietary fused silica supplied by Hysitron, Inc., Corning 1737f, Corning 2947 (soda-lime-silica), and Schott BK-7, respectively), and correlates their tendency to pile-up with the free volume of their network structures. Irrespective of the reference glass that is used, shallow penetration depths (i.e., < 150nm) should be corrected for the errors induced by pile-up in the reference glass to avoid anomalous trends in modulus and hardness during nanoindentation studies.
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U2 - 10.1016/j.matlet.2007.11.067
DO - 10.1016/j.matlet.2007.11.067
M3 - Article
AN - SCOPUS:40649114573
SN - 0167-577X
VL - 62
SP - 2140
EP - 2142
JO - Materials Letters
JF - Materials Letters
IS - 14
ER -