Coupled multifield finite element analysis model of upsetting under an applied direct current

Thomas J. Kronenberger, David H. Johnson, John T. Roth

Research output: Contribution to journalArticlepeer-review

34 Scopus citations

Fingerprint

Dive into the research topics of 'Coupled multifield finite element analysis model of upsetting under an applied direct current'. Together they form a unique fingerprint.

Engineering & Materials Science