TY - JOUR
T1 - Coupling of electrical and mechanical switching in nanoscale ferroelectrics
AU - Cao, Ye
AU - Li, Qian
AU - Chen, Long Qing
AU - Kalinin, Sergei V.
N1 - Funding Information:
This research was sponsored by the Division of Materials Sciences and Engineering, Office of Science, Basic Energy Sciences, U.S. Department of Energy. A portion of this research was conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility. The phase-field simulation was collaborated with Professor Long-Qing Chen at Penn State, which is supported by the U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering under Award No. DE-FG02-07ER46417. The author would thank Dr. Yijia Gu for the useful discussion and comments.
Publisher Copyright:
© 2015 AIP Publishing LLC.
PY - 2015/11/16
Y1 - 2015/11/16
N2 - While electric field induced ferroelectric switching has been extensively studied and broadly utilized, pure mechanical switching via flexoelectric effect has recently opened up an alternative method for domain writing due to their highly localized, electrically erasable and electric damage free characteristics. Thus far, few studies have been made on the coupling effect of electro-mechanical switching in ferroelectric materials, likely due to the experimental difficulty in the accurate definition of the tip-surface contact area and in the identification of mechanical contribution from electrical effect. Here, we employed self-consistent phase-field modeling to investigate the bi-polar switching behavior of (001) oriented Pb(Zr0.2Ti0.8)O3 thin film under concurrent electric and strain field created via a piezoresponse force microscope probe. By separating the effects from electric field, homogeneous strain and strain gradient, we revealed that the homogeneous strain suppresses the spontaneous polarization and accordingly increases the coercive field, and the strain gradient favors unipolar switching and inhibit it in the reverse direction, thus causing lateral offset of the hysteresis loop. The uncertainty of flexoelectric coefficients and the influence of flexocoupling coefficients on switching have also been discussed. Our study could necessitate further understanding of the electric, piezoelectric, and flexoelectric contribution to the switching behavior in nanoscale ferroelectric oxides.
AB - While electric field induced ferroelectric switching has been extensively studied and broadly utilized, pure mechanical switching via flexoelectric effect has recently opened up an alternative method for domain writing due to their highly localized, electrically erasable and electric damage free characteristics. Thus far, few studies have been made on the coupling effect of electro-mechanical switching in ferroelectric materials, likely due to the experimental difficulty in the accurate definition of the tip-surface contact area and in the identification of mechanical contribution from electrical effect. Here, we employed self-consistent phase-field modeling to investigate the bi-polar switching behavior of (001) oriented Pb(Zr0.2Ti0.8)O3 thin film under concurrent electric and strain field created via a piezoresponse force microscope probe. By separating the effects from electric field, homogeneous strain and strain gradient, we revealed that the homogeneous strain suppresses the spontaneous polarization and accordingly increases the coercive field, and the strain gradient favors unipolar switching and inhibit it in the reverse direction, thus causing lateral offset of the hysteresis loop. The uncertainty of flexoelectric coefficients and the influence of flexocoupling coefficients on switching have also been discussed. Our study could necessitate further understanding of the electric, piezoelectric, and flexoelectric contribution to the switching behavior in nanoscale ferroelectric oxides.
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U2 - 10.1063/1.4935977
DO - 10.1063/1.4935977
M3 - Article
AN - SCOPUS:84969674608
SN - 0003-6951
VL - 107
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 20
M1 - 202905
ER -