Abstract
The adsorption of Cl2 on Cu{111} at 300 K has been studied using shadow-cone-enhanced secondary ion mass spectrometry (SIMS). The system has been investigated for chlorine coverages ranging from 0.08 to 0.33 monolayer (ML), including the Cu{111}-(√3 × √3)R30°-Cl surface. The secondary Cu+ ion intensity has been measured as a function of the incidence angle of the primary ion beam. The enhanced intensity features in the spectra are compared with results from a two-body interaction calculation that uses the Molière approximation to the Thomas-Fermi potential. A chlorine-copper interlayer spacing of 1.87 ± 0.04 Å is measured between the coverages of 0.17 and 0.33 ML. This value corresponds to a chlorine-copper bond length of 2.38 ± 0.04 Å. At 0.08 ML, the chlorine-copper bond length is expanded to 2.48 ± 0.04 Å. These results suggest that the chlorine-copper bond is more ionic in the low coverage limit.
Original language | English (US) |
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Pages (from-to) | 137-141 |
Number of pages | 5 |
Journal | Surface and Interface Analysis |
Volume | 24 |
Issue number | 2 |
DOIs | |
State | Published - Jan 1 1996 |
All Science Journal Classification (ASJC) codes
- General Chemistry
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry