Cramming More Weight Data Onto Compute-in-Memory Macros for High Task-Level Energy Efficiency Using Custom ROM With 3984-kb/mm2Density in 65-nm CMOS

Guodong Yin, Yiming Chen, Mufeng Zhou, Wenjun Tang, Mingyen Lee, Zekun Yang, Tianyu Liao, Xirui Du, Vijaykrishnan Narayanan, Huazhong Yang, Hongyang Jia, Yongpan Liu, Xueqing Li

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

Owing to the mature process and low access energy, static random-access memory (SRAM) has become a promising candidate for compute-in-memory (CiM) acceleration of multiply-accumulate (MAC) operations. However, SRAM-based CiM cells have rather low density and thus very limited total on-chip memory capacity. This fact, unfortunately, results in undesired weight data reload operations from the off-chip dynamic random-access memory (DRAM) in data-intensive scenarios and may even tarnish the energy efficiency of CiM at the task level. Therefore, exploration toward higher density CiM in CMOS is critical to ensure truly high energy efficiency in practice. Aligned with the goal of ultrahigh density, this article presents the first one-transistor (1T) multi-level-cell (MLC) read-only memory (ROM) CiM macro for multi-bit MAC. The highlights of the proposed ROM CiM techniques include: 1) multi-source-driven (MSD) 1T-MLC ROM; 2) charge-domain capacitor sharing (CDCS) for ultrahigh CiM memory density; and 3) ROM-based transfer-learning architectures to provide flexible support of different tasks with minor accuracy degradation. These techniques are demonstrated with a fabricated 2-Mb 1T-MLC ROM CiM macro for 8 b times 8 b MAC computing. This macro features a record-high cell density of 0.096-mu text{m}{2} /bit and a macro weight density of 3984 kb/mm2 in a 65-nm pure CMOS technology. It also achieves 3.8times -55.3times lower energy consumption per image inference than the state-of-the-art CiM macros when considering the possible DRAM access.

Original languageEnglish (US)
Pages (from-to)1912-1925
Number of pages14
JournalIEEE Journal of Solid-State Circuits
Volume59
Issue number6
DOIs
StatePublished - Jun 1 2024

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Cramming More Weight Data Onto Compute-in-Memory Macros for High Task-Level Energy Efficiency Using Custom ROM With 3984-kb/mm2Density in 65-nm CMOS'. Together they form a unique fingerprint.

Cite this