TY - JOUR
T1 - CRISTA
T2 - A new paradigm for low-power, variation-tolerant, and adaptive circuit synthesis using critical path isolation
AU - Ghosh, Swaroop
AU - Bhunia, Swarup
AU - Roy, Kaushik
N1 - Funding Information:
Manuscript received July 17, 2006; revised January 18, 2007. This work was supported in part by Gigascale System Research Center (GSRC), and in part by Semiconductor Research Corporation (SRC) under Grant 1078.002. This paper was recommended by Associate Editor S. Vrudhula.
PY - 2007/11
Y1 - 2007/11
N2 - Design considerations for robustness with respect to variations and low-power operations typically impose contradictory design requirements. Low-power design techniques such as voltage scaling, dual- Vth, etc., can have a large negative impact on parametric yield. In this paper, we propose a novel paradigm for low-power variation-tolerant circuit design called CRitical path ISolation for Timing Adaptiveness (CRISTA), which allows aggressive voltage scaling. The principal idea includes the following: 1) isolate and predict the set of possible paths that may become critical under process variations; 2) ensure that they are activated rarely; and 3) avoid possible delay failures in the critical paths by dynamically switching to two-cycle operation (assuming all standard operations are single cycle), when they are activated. This allows us to operate the circuit at reduced supply voltage while achieving the required yield. Simulation results on a set of benchmark circuits with Berkeley-predictive-technology-model [BPTM 70 nm: Berkeley predictive technology model] 70-nm devices that show an average of 60% improvement in power with small overhead in performance and 18% overhead in die area compared to conventional design. We also present two applications of the proposed methodology that include the following: 1) pipeline design for low power and 2) temperature-adaptive circuit design.
AB - Design considerations for robustness with respect to variations and low-power operations typically impose contradictory design requirements. Low-power design techniques such as voltage scaling, dual- Vth, etc., can have a large negative impact on parametric yield. In this paper, we propose a novel paradigm for low-power variation-tolerant circuit design called CRitical path ISolation for Timing Adaptiveness (CRISTA), which allows aggressive voltage scaling. The principal idea includes the following: 1) isolate and predict the set of possible paths that may become critical under process variations; 2) ensure that they are activated rarely; and 3) avoid possible delay failures in the critical paths by dynamically switching to two-cycle operation (assuming all standard operations are single cycle), when they are activated. This allows us to operate the circuit at reduced supply voltage while achieving the required yield. Simulation results on a set of benchmark circuits with Berkeley-predictive-technology-model [BPTM 70 nm: Berkeley predictive technology model] 70-nm devices that show an average of 60% improvement in power with small overhead in performance and 18% overhead in die area compared to conventional design. We also present two applications of the proposed methodology that include the following: 1) pipeline design for low power and 2) temperature-adaptive circuit design.
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U2 - 10.1109/TCAD.2007.896305
DO - 10.1109/TCAD.2007.896305
M3 - Article
AN - SCOPUS:54249104938
SN - 0278-0070
VL - 26
SP - 1947
EP - 1956
JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
JF - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IS - 11
M1 - 4352005
ER -