Critical current density and resistivity of MgB2 films

J. M. Rowell, S. Y. Xu, X. H. Zeng, A. V. Pogrebnyakov, Qi Li, X. X. Xi, J. M. Redwing, W. Tian, Xiaoqing Pan

Research output: Contribution to journalArticlepeer-review

74 Scopus citations

Abstract

A description of critical current density and resistivity of MgB2 films was presented. The two phenomenon can be explained by the suggestion that only a fraction of the cross-sectional area of the samples carries the effective current. Measurements of ρ(T) and Jc for a number of films made by hybrid physical-chemical vapor deposition were also presented.

Original languageEnglish (US)
Pages (from-to)102-104
Number of pages3
JournalApplied Physics Letters
Volume83
Issue number1
DOIs
StatePublished - Jul 7 2003

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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