Critical current density and resistivity of MgB2 films

J. M. Rowell; S. Y. Xu; X. H. Zeng; A. V. Pogrebnyakov; Qi Li; X. X. Xi; J. M. Redwing; W. Tian; Xiaoqing Pan

doi:10.1063/1.1590734

Critical current density and resistivity of MgB₂ films

J. M. Rowell
, S. Y. Xu
, X. H. Zeng
, A. V. Pogrebnyakov
, Qi Li
, X. X. Xi
, J. M. Redwing
, W. Tian
, Xiaoqing Pan

Research output: Contribution to journal › Article › peer-review

75 Scopus citations

Abstract

A description of critical current density and resistivity of MgB₂ films was presented. The two phenomenon can be explained by the suggestion that only a fraction of the cross-sectional area of the samples carries the effective current. Measurements of ρ(T) and J_c for a number of films made by hybrid physical-chemical vapor deposition were also presented.

Original language	English (US)
Pages (from-to)	102-104
Number of pages	3
Journal	Applied Physics Letters
Volume	83
Issue number	1
DOIs	https://doi.org/10.1063/1.1590734
State	Published - Jul 7 2003

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.1590734

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@article{80a6911376c24b5fa3e088a883afe43d,

title = "Critical current density and resistivity of MgB2 films",

abstract = "A description of critical current density and resistivity of MgB2 films was presented. The two phenomenon can be explained by the suggestion that only a fraction of the cross-sectional area of the samples carries the effective current. Measurements of ρ(T) and Jc for a number of films made by hybrid physical-chemical vapor deposition were also presented.",

author = "Rowell, \{J. M.\} and Xu, \{S. Y.\} and Zeng, \{X. H.\} and Pogrebnyakov, \{A. V.\} and Qi Li and Xi, \{X. X.\} and Redwing, \{J. M.\} and W. Tian and Xiaoqing Pan",

year = "2003",

month = jul,

day = "7",

doi = "10.1063/1.1590734",

language = "English (US)",

volume = "83",

pages = "102--104",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "1",

}

TY - JOUR

T1 - Critical current density and resistivity of MgB2 films

AU - Rowell, J. M.

AU - Xu, S. Y.

AU - Zeng, X. H.

AU - Pogrebnyakov, A. V.

AU - Li, Qi

AU - Xi, X. X.

AU - Redwing, J. M.

AU - Tian, W.

AU - Pan, Xiaoqing

PY - 2003/7/7

Y1 - 2003/7/7

N2 - A description of critical current density and resistivity of MgB2 films was presented. The two phenomenon can be explained by the suggestion that only a fraction of the cross-sectional area of the samples carries the effective current. Measurements of ρ(T) and Jc for a number of films made by hybrid physical-chemical vapor deposition were also presented.

AB - A description of critical current density and resistivity of MgB2 films was presented. The two phenomenon can be explained by the suggestion that only a fraction of the cross-sectional area of the samples carries the effective current. Measurements of ρ(T) and Jc for a number of films made by hybrid physical-chemical vapor deposition were also presented.

UR - https://www.scopus.com/pages/publications/0042205644

UR - https://www.scopus.com/pages/publications/0042205644#tab=citedBy

U2 - 10.1063/1.1590734

DO - 10.1063/1.1590734

M3 - Article

AN - SCOPUS:0042205644

SN - 0003-6951

VL - 83

SP - 102

EP - 104

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 1

ER -

Critical current density and resistivity of MgB₂ films

Abstract

All Science Journal Classification (ASJC) codes

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