Abstract
The I-V curves of Bi-Sr-Ca-Cu-O superconductors were measured in DC magnetic fields, oriented both parallel and perpendicular to the tape surface, up to 33 T, 4.2 K, in resistive magnets at the National High Magnetic Field Laboratory. This paper presents the experimental set-up, results of critical current measurements, and an analysis of the obtained Ic(B) curves in terms of strongly and weakly linked current paths. A distinct double-step behavior is observed for field perpendicular to the tape surface. The scaling behavior of the applied field with its component perpendicular to the ab-plane, and the implied average grain-misalignment angle, is investigated.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 3956-3959 |
| Number of pages | 4 |
| Journal | IEEE Transactions on Applied Superconductivity |
| Volume | 11 |
| Issue number | 1 III |
| DOIs | |
| State | Published - Mar 2001 |
| Event | 2000 Applied Superconductivity Conference - Virginia Beach, VA, United States Duration: Sep 17 2000 → Sep 22 2000 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
Fingerprint
Dive into the research topics of 'Critical currents in Bi-Sr-Ca-Cu-O superconductors up to 33 T at 4.2 K'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver