Crystal growth and characterization of Sr₃TaGa ₃Si₂O₁₄ single crystals

High quality piezoelectric single crystals Sr₃TaGa ₃Si₂O₁₄ were grown using the conventional Czochralski method along the Y-axis. The mass density was found to be 5.121 g cm^-3 by the Archimedes method. The relative dielectric constants, piezoelectric strain coefficients and elastic compliance constants of Sr ₃TaGa₃Si₂O₁₄ single crystals were determined by an electric bridge and the resonant-antiresonant method at room temperature. The results were , , d₁₁ = -4.90 pC N^-1, d₁₄ = 3.20 pC N^-1; ; ; ; ; ; and , respectively. The temperature dependent behaviour of elastic compliance constants was also investigated, where zero temperature compensated cuts were not found in the range from -40 to 120 °C.