TY - JOUR
T1 - Crystal ion slicing of domain microengineered electro-optic devices on lithium niobate
AU - Scrymgeour, David A.
AU - Gopalan, Venkatraman
AU - Haynes, Tony E.
N1 - Funding Information:
Acknowledgements This work was partially supported by the funds made available to Dr. V. Gopalan through the National Science Foundation and the DARPA-STAB program. Modification and Characterization Research Center of Oak Ridge National Laboratory was sponsored by the U.S. Department of Energy, Office of Science under contract DE-AC05-000R22725 with UT-Battelle, LLC.
PY - 2001
Y1 - 2001
N2 - We report the successful fabrication of 6 um thick slices from a ferroelectric domain micro-engineered LiNb03 wafer device using the crystal ion slicing technique. The device was created by micropatterning ferroelectric domains in a bulk 0.3 mm thick wafer of z-cut LiNbOb, followed by ion-implanting with high energy He+ ions to create a damage layer at a well defined depth from the surface. Etching away this damaged layer in dilute hydrofluoric acid results in a liftoff of the top slice in which the ferroelectric domain patterns are left intact.
AB - We report the successful fabrication of 6 um thick slices from a ferroelectric domain micro-engineered LiNb03 wafer device using the crystal ion slicing technique. The device was created by micropatterning ferroelectric domains in a bulk 0.3 mm thick wafer of z-cut LiNbOb, followed by ion-implanting with high energy He+ ions to create a damage layer at a well defined depth from the surface. Etching away this damaged layer in dilute hydrofluoric acid results in a liftoff of the top slice in which the ferroelectric domain patterns are left intact.
UR - http://www.scopus.com/inward/record.url?scp=11244295392&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=11244295392&partnerID=8YFLogxK
U2 - 10.1080/10584580108012805
DO - 10.1080/10584580108012805
M3 - Article
AN - SCOPUS:11244295392
SN - 1058-4587
VL - 41
SP - 35
EP - 42
JO - Integrated Ferroelectrics
JF - Integrated Ferroelectrics
IS - 1-4
ER -