Current density effects on the microstructure of zirconium thin films

Zahabul Islam; Baoming Wang; Aman Haque

doi:10.1016/j.scriptamat.2017.09.032

Current density effects on the microstructure of zirconium thin films

Zahabul Islam, Baoming Wang, Aman Haque

Research output: Contribution to journal › Article › peer-review

39 Scopus citations

Abstract

We investigate the effect of electrical current density below the electromigration failure limit in nanocrystalline zirconium thin films using in-situ Transmission Electron Microscope and molecular dynamics simulation. At least one order of magnitude higher growth was seen at current density of 8.5 × 10⁵ A/cm² (Joule heating temperature 710 K) in 15 min compared to conventional thermal annealing at 873 K for 360 min. Simulation results support our hypothesis that the concurrent effects of electron wind force and Joule heating specifically target the grain boundaries, producing much higher grain boundary mobility compared to high temperature annealing alone.

Original language	English (US)
Pages (from-to)	18-21
Number of pages	4
Journal	Scripta Materialia
Volume	144
DOIs	https://doi.org/10.1016/j.scriptamat.2017.09.032
State	Published - Feb 2018

All Science Journal Classification (ASJC) codes

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
Metals and Alloys

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10.1016/j.scriptamat.2017.09.032

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title = "Current density effects on the microstructure of zirconium thin films",

abstract = "We investigate the effect of electrical current density below the electromigration failure limit in nanocrystalline zirconium thin films using in-situ Transmission Electron Microscope and molecular dynamics simulation. At least one order of magnitude higher growth was seen at current density of 8.5 × 105 A/cm2 (Joule heating temperature 710 K) in 15 min compared to conventional thermal annealing at 873 K for 360 min. Simulation results support our hypothesis that the concurrent effects of electron wind force and Joule heating specifically target the grain boundaries, producing much higher grain boundary mobility compared to high temperature annealing alone.",

author = "Zahabul Islam and Baoming Wang and Aman Haque",

note = "Funding Information: We acknowledge the support of the US Department of Energy funding ( DE-NE0008259 ) and from the National Science Foundation ( DMR 1609060 ). The fabrication was performed at the Pennsylvania State University Nanofabrication Facility. All experiments were performed at the Pennsylvania State University Materials Characterization Facility. Publisher Copyright: {\textcopyright} 2017 Acta Materialia Inc.",

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doi = "10.1016/j.scriptamat.2017.09.032",

language = "English (US)",

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T1 - Current density effects on the microstructure of zirconium thin films

AU - Islam, Zahabul

AU - Wang, Baoming

AU - Haque, Aman

N1 - Funding Information: We acknowledge the support of the US Department of Energy funding ( DE-NE0008259 ) and from the National Science Foundation ( DMR 1609060 ). The fabrication was performed at the Pennsylvania State University Nanofabrication Facility. All experiments were performed at the Pennsylvania State University Materials Characterization Facility. Publisher Copyright: © 2017 Acta Materialia Inc.

PY - 2018/2

Y1 - 2018/2

N2 - We investigate the effect of electrical current density below the electromigration failure limit in nanocrystalline zirconium thin films using in-situ Transmission Electron Microscope and molecular dynamics simulation. At least one order of magnitude higher growth was seen at current density of 8.5 × 105 A/cm2 (Joule heating temperature 710 K) in 15 min compared to conventional thermal annealing at 873 K for 360 min. Simulation results support our hypothesis that the concurrent effects of electron wind force and Joule heating specifically target the grain boundaries, producing much higher grain boundary mobility compared to high temperature annealing alone.

AB - We investigate the effect of electrical current density below the electromigration failure limit in nanocrystalline zirconium thin films using in-situ Transmission Electron Microscope and molecular dynamics simulation. At least one order of magnitude higher growth was seen at current density of 8.5 × 105 A/cm2 (Joule heating temperature 710 K) in 15 min compared to conventional thermal annealing at 873 K for 360 min. Simulation results support our hypothesis that the concurrent effects of electron wind force and Joule heating specifically target the grain boundaries, producing much higher grain boundary mobility compared to high temperature annealing alone.

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JO - Scripta Materialia

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ER -

Current density effects on the microstructure of zirconium thin films

Abstract

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