Abstract
— α-Ga2O3 is one of the ultra-wide bandgap semiconductors that gives promise to the development of next-generation power electronics. However, due to its thermodynamic instability and low thermal conductivity, overheating concerns hinder the deployment of α-Ga2O3 devices. This study reveals the detrimental impact of thermal crosstalk in multi-finger α-Ga2O3 MOSFETs. The thermal conductivity of α-Ga2O3 (∼12 W/m·K at room temperature) was determined via first-principles calculations and laser-based pump-probe measurements. Device thermal characterization and modeling were performed to design a vertebrae-shaped multi-finger device layout that mitigates thermal crosstalk by decentralizing the overall device heat generation profile.
Original language | English (US) |
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Pages (from-to) | 266-269 |
Number of pages | 4 |
Journal | IEEE Electron Device Letters |
Volume | 46 |
Issue number | 2 |
DOIs | |
State | Published - 2025 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering