Deep electron and hole traps in 6H-SiC bulk crystals grown by the halide chemical vapor deposition

S. W. Huh, A. Y. Polyakov, H. J. Chung, S. Nigam, M. Skowronski, E. R. Glaser, W. E. Carlos, M. A. Fanton, N. B. Smirnov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

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Keyphrases

Material Science

Engineering