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Defect interactions of H2 in SiO2: Implications for ELDRS and latent interface trap buildup

  • Blair R. Tuttle
  • , David R. Hughart
  • , Ronald D. Schrimpf
  • , Daniel M. Fleetwood
  • , Sokrates T. Pantelides

Research output: Contribution to journal › Article › peer-review

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Material Science