TY - GEN
T1 - Defect sizing in pipe using an ultrasonic guided wave focusing technique
AU - Jing, Mu
AU - Li, Zhang
AU - Rose, Joseph L.
AU - Spanner, Jack
PY - 2006/3/6
Y1 - 2006/3/6
N2 - Defect circumferential location, circumferential length and depth are studied with an ultrasonic guided wave focusing inspection technique. Differently shaped defects, such as a planar saw cut, a volumetric through-wall hole, and a volumetric spherical shape corrosion are studied. By focusing on 44 circumferential positions around the pipe at a specific distance, the maximum amplitude of the defect echo is recorded with respect to each circumferential focal position. Circumferential lengths of the planar saw cut and volumetric through-wall hole are then measured by comparing the experimental results with theoretical calculations. It is shown that this measurement technique works well with the planar saw cut and volumetric through-wall hole defects. In addition, it is shown that reflections from defects with the same cross sectional area (CSA), but different shapes, might be very different.
AB - Defect circumferential location, circumferential length and depth are studied with an ultrasonic guided wave focusing inspection technique. Differently shaped defects, such as a planar saw cut, a volumetric through-wall hole, and a volumetric spherical shape corrosion are studied. By focusing on 44 circumferential positions around the pipe at a specific distance, the maximum amplitude of the defect echo is recorded with respect to each circumferential focal position. Circumferential lengths of the planar saw cut and volumetric through-wall hole are then measured by comparing the experimental results with theoretical calculations. It is shown that this measurement technique works well with the planar saw cut and volumetric through-wall hole defects. In addition, it is shown that reflections from defects with the same cross sectional area (CSA), but different shapes, might be very different.
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U2 - 10.1063/1.2184603
DO - 10.1063/1.2184603
M3 - Conference contribution
AN - SCOPUS:33845432300
SN - 0735403120
SN - 9780735403123
T3 - AIP Conference Proceedings
SP - 760
EP - 766
BT - Review of Progress in Quantitative Nondestructive Evaluation
T2 - Review of Progress in Quantitative Nondestructive
Y2 - 31 July 2005 through 5 August 2005
ER -