Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study

N. Alem; O. V. Yazyev; Q. M. Ramasse; C. R. Seabourne; C. K. Kisielowski; P. Hartel; B. Jiang; R. Erni; A. J. Scott; S. G. Louie; A. Zettl

doi:10.1017/S1431927612009439

Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study

N. Alem
, O. V. Yazyev
, Q. M. Ramasse
, C. R. Seabourne
, C. K. Kisielowski
, P. Hartel
, B. Jiang
, R. Erni
, A. J. Scott
, S. G. Louie
, A. Zettl

Research output: Contribution to journal › Article › peer-review

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Original language	English (US)
Pages (from-to)	1516-1517
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	18
Issue number	S2
DOIs	https://doi.org/10.1017/S1431927612009439
State	Published - Jul 2012

All Science Journal Classification (ASJC) codes

Instrumentation

Access to Document

10.1017/S1431927612009439

Cite this

@article{87653ae2768a4ba2a99440b200a5c23d,

title = "Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study",

abstract = "Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.",

author = "N. Alem and Yazyev, \{O. V.\} and Ramasse, \{Q. M.\} and Seabourne, \{C. R.\} and Kisielowski, \{C. K.\} and P. Hartel and B. Jiang and R. Erni and Scott, \{A. J.\} and Louie, \{S. G.\} and A. Zettl",

year = "2012",

month = jul,

doi = "10.1017/S1431927612009439",

language = "English (US)",

volume = "18",

pages = "1516--1517",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "S2",

}

TY - JOUR

T1 - Defects in Two Dimensional Crystals

T2 - An Ultra-high Resolution Aberration-corrected Electron Microscopy Study

AU - Alem, N.

AU - Yazyev, O. V.

AU - Ramasse, Q. M.

AU - Seabourne, C. R.

AU - Kisielowski, C. K.

AU - Hartel, P.

AU - Jiang, B.

AU - Erni, R.

AU - Scott, A. J.

AU - Louie, S. G.

AU - Zettl, A.

PY - 2012/7

Y1 - 2012/7

N2 - Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

AB - Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

UR - https://www.scopus.com/pages/publications/85011457570

UR - https://www.scopus.com/pages/publications/85011457570#tab=citedBy

U2 - 10.1017/S1431927612009439

DO - 10.1017/S1431927612009439

M3 - Article

AN - SCOPUS:85011457570

SN - 1431-9276

VL - 18

SP - 1516

EP - 1517

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S2

ER -

Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this