Abstract
We demonstrate molecular beam epitaxy (MBE) grown degenerately doped InGaBiAs:Si as a new transparent contact material usable from the near-infrared (near-IR) to the mid-infrared (mid-IR). This material system can exhibit high transparency over large portions ofthe 1.3- 12.5 μm wavelength range, with the exact transparency windows determined by the material carrier concentration. As a comparison, the transmittance of the more conventional IR contact material, Indium Tin Oxide (ITO), drops rapidly for wavelengths longer than1.5 μm. The conductivity of InGaBiAs:Si is also much higher than ITO due to its high doping concentration and good mobility. Our transmission spectra are modeled using a transfermatrix formalism, and the resulting modeled IR transmission spectra closely match our experimental results with proper choice of two fitting parameters, the material plasma frequency and the scattering rate.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1197-1204 |
| Number of pages | 8 |
| Journal | Optical Materials Express |
| Volume | 3 |
| Issue number | 8 |
| DOIs | |
| State | Published - 2013 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
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