DEPTH PROFILES OF SODIUM AND CALCIUM IN GLASSES: A COMPARISON OF SECONDARY ION MASS ANALYSIS AND AUGER SPECTROMETRY.

D. L. Malm; M. J. Vasile; F. J. Padden; D. B. Dove; C. G. Pantano

doi:10.1116/1.569433

DEPTH PROFILES OF SODIUM AND CALCIUM IN GLASSES: A COMPARISON OF SECONDARY ION MASS ANALYSIS AND AUGER SPECTROMETRY.

D. L. Malm, M. J. Vasile, F. J. Padden, D. B. Dove, C. G. Pantano

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

23 Scopus citations

Abstract

Depth profiles of sodium and calcium in soda-lime glasses have been measured by both Auger electron spectrometry and secondary ion mass spectrometry. Profiles by the two techniques agree closely and can be influenced by experimental conditions. In particular, radiation heating from a charge neutralization filament in the SIMS system is shown to alter the sodium depth profile in specimens which have a surface depletion of sodium.

Original language	English (US)
Pages (from-to)	35-38
Number of pages	4
Journal	J VAC SCI TECHNOL
Volume	15
Issue number	1
DOIs	https://doi.org/10.1116/1.569433
State	Published - 1978

All Science Journal Classification (ASJC) codes

General Engineering

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10.1116/1.569433

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title = "DEPTH PROFILES OF SODIUM AND CALCIUM IN GLASSES: A COMPARISON OF SECONDARY ION MASS ANALYSIS AND AUGER SPECTROMETRY.",

abstract = "Depth profiles of sodium and calcium in soda-lime glasses have been measured by both Auger electron spectrometry and secondary ion mass spectrometry. Profiles by the two techniques agree closely and can be influenced by experimental conditions. In particular, radiation heating from a charge neutralization filament in the SIMS system is shown to alter the sodium depth profile in specimens which have a surface depletion of sodium.",

author = "Malm, {D. L.} and Vasile, {M. J.} and Padden, {F. J.} and Dove, {D. B.} and Pantano, {C. G.}",

year = "1978",

doi = "10.1116/1.569433",

language = "English (US)",

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AU - Vasile, M. J.

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AU - Dove, D. B.

AU - Pantano, C. G.

PY - 1978

Y1 - 1978

N2 - Depth profiles of sodium and calcium in soda-lime glasses have been measured by both Auger electron spectrometry and secondary ion mass spectrometry. Profiles by the two techniques agree closely and can be influenced by experimental conditions. In particular, radiation heating from a charge neutralization filament in the SIMS system is shown to alter the sodium depth profile in specimens which have a surface depletion of sodium.

AB - Depth profiles of sodium and calcium in soda-lime glasses have been measured by both Auger electron spectrometry and secondary ion mass spectrometry. Profiles by the two techniques agree closely and can be influenced by experimental conditions. In particular, radiation heating from a charge neutralization filament in the SIMS system is shown to alter the sodium depth profile in specimens which have a surface depletion of sodium.

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DEPTH PROFILES OF SODIUM AND CALCIUM IN GLASSES: A COMPARISON OF SECONDARY ION MASS ANALYSIS AND AUGER SPECTROMETRY.

Abstract

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