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Depth-resolved ultra-violet spectroscopic photo current-voltage measurements for the analysis of AlGaN/GaN high electron mobility transistor epilayer deposited on Si

  • Burcu Ozden
  • , Chungman Yang
  • , Fei Tong
  • , Min P. Khanal
  • , Vahid Mirkhani
  • , Mobbassar Hassan Sk
  • , Ayayi Claude Ahyi
  • , Minseo Park

Research output: Contribution to journal › Article › peer-review

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