TY - GEN
T1 - Design and analysis of novel SRAM PUFs with embedded latch for robustness
AU - Jang, Jae Won
AU - Ghosh, Swaroop
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/4/13
Y1 - 2015/4/13
N2 - Physical Unclonable Function (PUF) is a cost-effective security primitive to address hardware attacks such as cloning, impersonation and Intellectual Property (IP) violation. Static Random-Access Memory (SRAM) PUF has been proposed; however, it suffers from challenges, some of which are environmental fluctuations such as voltage, temperature, and noise. Ensuring the robustness of SRAM PUF under such conditions is challenging. In this paper, we propose 8T SRAM PUF with a back-to-back PMOS latch to improve robustness by 4X. We also propose a low-power 7T SRAM with embedded Magnetic Tunnel Junction (MTJ) devices to enhance the robustness (2.3X to 20X) while lowering the leakage power and area overhead.
AB - Physical Unclonable Function (PUF) is a cost-effective security primitive to address hardware attacks such as cloning, impersonation and Intellectual Property (IP) violation. Static Random-Access Memory (SRAM) PUF has been proposed; however, it suffers from challenges, some of which are environmental fluctuations such as voltage, temperature, and noise. Ensuring the robustness of SRAM PUF under such conditions is challenging. In this paper, we propose 8T SRAM PUF with a back-to-back PMOS latch to improve robustness by 4X. We also propose a low-power 7T SRAM with embedded Magnetic Tunnel Junction (MTJ) devices to enhance the robustness (2.3X to 20X) while lowering the leakage power and area overhead.
UR - http://www.scopus.com/inward/record.url?scp=84944319029&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84944319029&partnerID=8YFLogxK
U2 - 10.1109/ISQED.2015.7085443
DO - 10.1109/ISQED.2015.7085443
M3 - Conference contribution
AN - SCOPUS:84944319029
T3 - Proceedings - International Symposium on Quality Electronic Design, ISQED
SP - 298
EP - 302
BT - Proceedings of the 16th International Symposium on Quality Electronic Design, ISQED 2015
PB - IEEE Computer Society
T2 - 16th International Symposium on Quality Electronic Design, ISQED 2015
Y2 - 2 March 2015 through 4 March 2015
ER -