Abstract
One key problem of fringe projection techniques for 3D shape measurements is the limited phase unambiguity range when only one grating period is used. Dual-frequency patterns in which involves two grating periods can easily extend the unambiguity range. A method to fabricate accurate dual-frequency patterns is presented. The advantage of using digital dual-frequency patterns for projected fringe profilometry are (1) high geometrical accuracy (< 0.5μm); (2) high contrast ratio; (3) very low high order harmonic distortions; and (4) extended unambiguity range.
| Original language | English (US) |
|---|---|
| Article number | 20 |
| Pages (from-to) | 132-141 |
| Number of pages | 10 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 5606 |
| DOIs | |
| State | Published - 2004 |
| Event | Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II - Philadelphia, PA, United States Duration: Oct 26 2004 → Oct 27 2004 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
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