Design and manufacture of a capacitance probe for hole metrology

Philip T. Smith, Christopher J. Morgan, R. Ryan Vallance, Ingrid St Omer, Eric R. Marsh

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Proceedings of the 20th Annual ASPE Meeting, ASPE 2005
State	Published - 2005
Event	20th Annual Meeting of the American Society for Precision Engineering, ASPE 2005 - Norfolk, VA, United States Duration: Oct 9 2005 → Oct 14 2005

Name	Proceedings of the 20th Annual ASPE Meeting, ASPE 2005

Other	20th Annual Meeting of the American Society for Precision Engineering, ASPE 2005
Country/Territory	United States
City	Norfolk, VA
Period	10/9/05 → 10/14/05

All Science Journal Classification (ASJC) codes

@inproceedings{bd0e06cf9ba54e289ffd836a36690878,

title = "Design and manufacture of a capacitance probe for hole metrology",

author = "Smith, \{Philip T.\} and Morgan, \{Christopher J.\} and Vallance, \{R. Ryan\} and Omer, \{Ingrid St\} and Marsh, \{Eric R.\}",

year = "2005",

language = "English (US)",

isbn = "1887706399",

series = "Proceedings of the 20th Annual ASPE Meeting, ASPE 2005",

booktitle = "Proceedings of the 20th Annual ASPE Meeting, ASPE 2005",

note = "20th Annual Meeting of the American Society for Precision Engineering, ASPE 2005 ; Conference date: 09-10-2005 Through 14-10-2005",

}

TY - GEN

T1 - Design and manufacture of a capacitance probe for hole metrology

AU - Smith, Philip T.

AU - Morgan, Christopher J.

AU - Vallance, R. Ryan

AU - Omer, Ingrid St

AU - Marsh, Eric R.

PY - 2005

Y1 - 2005

UR - https://www.scopus.com/pages/publications/84884874155

UR - https://www.scopus.com/inward/citedby.url?scp=84884874155&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84884874155

SN - 1887706399

SN - 9781887706391

T3 - Proceedings of the 20th Annual ASPE Meeting, ASPE 2005

BT - Proceedings of the 20th Annual ASPE Meeting, ASPE 2005

T2 - 20th Annual Meeting of the American Society for Precision Engineering, ASPE 2005

Y2 - 9 October 2005 through 14 October 2005

ER -