Design, fabrication, and reliability assessment of embedded resistors and capacitors on multilayered organic substrates

K. J. Lee, Swapan Bhattacharya, Mahesh Varadarajan, Lixi Wan, Isaac Robin Abothu, Venky Sundaram, Prathap Muthana, Devarajan Balaraman, P. M. Raj, Madhavan Swaminathan, Suresh Sitaraman, Rao Tummala, Puligandla Viswanadham, Steven Dunford, John Lauffer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Scopus citations

Abstract

Embedded passives provide a practical solution to microelectronics miniaturization. In a typical circuit, over 80 percent of the electronic components are passives such as resistors, inductors, and capacitors that could take up to 50 percent of the entire printed circuit board area. By integrating passive components within the substrate, embedded passives reduce the system real estate, eliminate the need for discrete components and assembly of same, enhance electrical performance and reliability, and potentially reduce the overall cost. Moreover, it is lead free. Even with these advantages, embedded passive technology is at a relatively immature stage and more characterization and optimization are needed for practical applications leading to its commercialization. This paper presents an entire process from design and fabrication to electrical characterization and reliability test of embedded passives on multilayered microvia organic substrate. Two test vehicles focusing on resistors and capacitors have been designed and fabricated by Packaging Research Center (PRC) and Endicott Interconnect Technologies (EI). Resistors are carbon ink based Polymer Thick Film (PTF) and NiCrAlSi, and capacitors are made with polymer/ceramic nanocomposite material. High frequency measurement of these capacitors was performed. Furthermore, reliability assessments of thermal shock and temperature humidity tests based on JEDEC standards are presented.

Original languageEnglish (US)
Title of host publicationProceedings - 2005 10th International Symposium on Advanced Packaging Materials
Subtitle of host publicationProcesses, Properties and Interfaces
Pages249-254
Number of pages6
DOIs
StatePublished - 2005
Event2005 10th International Symposium on Advanced Packaging Materials: Processes, Properties and Interfaces - Irvine, CA, United States
Duration: Mar 16 2005Mar 18 2005

Publication series

NameProceedings of the International Symposium and Exhibition on Advanced Packaging Materials Processes, Properties and Interfaces
Volume2005

Conference

Conference2005 10th International Symposium on Advanced Packaging Materials: Processes, Properties and Interfaces
Country/TerritoryUnited States
CityIrvine, CA
Period3/16/053/18/05

All Science Journal Classification (ASJC) codes

  • General Materials Science
  • General Engineering

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