Design of 2T/Cell and 3T/Cell Nonvolatile Memories with Emerging Ferroelectric FETs

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Article number8653894
Pages (from-to)39-45
Number of pages7
JournalIEEE Design and Test
Volume36
Issue number3
DOIs
StatePublished - Jun 2019

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

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