TY - JOUR
T1 - Destructive electronics from electrochemical-mechanically triggered chemical dissolution
AU - Sim, Kyoseung
AU - Wang, Xu
AU - Li, Yuhang
AU - Linghu, Changhong
AU - Gao, Yang
AU - Song, Jizhou
AU - Yu, Cunjiang
N1 - Funding Information:
This work was supported by the National Science Foundation (Grant No. ECCS-1509763 and CMMI-1554499) and New Faculty Research Grants from University of Houston. JS acknowledges the supports from the National Basic Research Program (Grant No. 2015CB351901), the National Natural Science Foundation of China (Grant Nos. 11372272, 11622221 and 11621062).
Publisher Copyright:
© 2017 IOP Publishing Ltd.
PY - 2017/5/8
Y1 - 2017/5/8
N2 - The considerable need to enhance data and hardware security suggest one possible future for electronics where it is possible to destroy them and even make them disappear physically. This paper reports a type of destructive electronics which features fast transience from chemical dissolution on-demand triggered in an electrochemical-mechanical manner. The detailed materials, mechanics, and device construction of the destructive electronics are presented. Experiment and analysis of the triggered releasing and transience study of electronic materials, resistors and metal-oxide-semiconductor field effect transistors illustrate the key aspects of the destructive electronics. The reported destructive electronics is useful in a wide range of areas from security and defense, to medical applications.
AB - The considerable need to enhance data and hardware security suggest one possible future for electronics where it is possible to destroy them and even make them disappear physically. This paper reports a type of destructive electronics which features fast transience from chemical dissolution on-demand triggered in an electrochemical-mechanical manner. The detailed materials, mechanics, and device construction of the destructive electronics are presented. Experiment and analysis of the triggered releasing and transience study of electronic materials, resistors and metal-oxide-semiconductor field effect transistors illustrate the key aspects of the destructive electronics. The reported destructive electronics is useful in a wide range of areas from security and defense, to medical applications.
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U2 - 10.1088/1361-6439/aa682f
DO - 10.1088/1361-6439/aa682f
M3 - Article
AN - SCOPUS:85019499673
SN - 0960-1317
VL - 27
JO - Journal of Micromechanics and Microengineering
JF - Journal of Micromechanics and Microengineering
IS - 6
M1 - 065010
ER -