Destructive electronics from electrochemical-mechanically triggered chemical dissolution

Kyoseung Sim, Xu Wang, Yuhang Li, Changhong Linghu, Yang Gao, Jizhou Song, Cunjiang Yu

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

The considerable need to enhance data and hardware security suggest one possible future for electronics where it is possible to destroy them and even make them disappear physically. This paper reports a type of destructive electronics which features fast transience from chemical dissolution on-demand triggered in an electrochemical-mechanical manner. The detailed materials, mechanics, and device construction of the destructive electronics are presented. Experiment and analysis of the triggered releasing and transience study of electronic materials, resistors and metal-oxide-semiconductor field effect transistors illustrate the key aspects of the destructive electronics. The reported destructive electronics is useful in a wide range of areas from security and defense, to medical applications.

Original languageEnglish (US)
Article number065010
JournalJournal of Micromechanics and Microengineering
Volume27
Issue number6
DOIs
StatePublished - May 8 2017

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials
  • Mechanical Engineering
  • Electrical and Electronic Engineering

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