TY - GEN
T1 - Detecting and matching repeated patterns for automatic geo-tagging in urban environments
AU - Schindler, Grant
AU - Krishnamurthy, Panchapagesan
AU - Lublinerman, Roberto
AU - Liu, Yanxi
AU - Dellaert, Frank
PY - 2008
Y1 - 2008
N2 - We present a novel method for automatically geo-tagging photographs of man-made environments via detection and matching of repeated patterns. Highly repetitive environments introduce numerous correspondence ambiguities and are problematic for traditional wide-baseline matching methods. Our method exploits the highly repetitive nature of urban environments, detecting multiple perspectively distorted periodic 2D patterns in an image and matching them to a 3D database of textured facades by reasoning about the underlying canonical forms of each pattern. Multiple 2D-to-3D pattern correspondences enable robust recovery of camera orientation and location. We demonstrate the success of this method in a large urban environment.
AB - We present a novel method for automatically geo-tagging photographs of man-made environments via detection and matching of repeated patterns. Highly repetitive environments introduce numerous correspondence ambiguities and are problematic for traditional wide-baseline matching methods. Our method exploits the highly repetitive nature of urban environments, detecting multiple perspectively distorted periodic 2D patterns in an image and matching them to a 3D database of textured facades by reasoning about the underlying canonical forms of each pattern. Multiple 2D-to-3D pattern correspondences enable robust recovery of camera orientation and location. We demonstrate the success of this method in a large urban environment.
UR - http://www.scopus.com/inward/record.url?scp=51949108641&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=51949108641&partnerID=8YFLogxK
U2 - 10.1109/CVPR.2008.4587461
DO - 10.1109/CVPR.2008.4587461
M3 - Conference contribution
AN - SCOPUS:51949108641
SN - 9781424422432
T3 - 26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR
BT - 26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR
T2 - 26th IEEE Conference on Computer Vision and Pattern Recognition, CVPR
Y2 - 23 June 2008 through 28 June 2008
ER -