Abstract
We demonstrate detection and sizing of single nanoparticles down to 30 nm by monitoring the mode splitting induced by a nanoparticle in an ultra-high quality factor (UHQ) microtoroid. Theory and methods are discussed.
Original language | English (US) |
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Title of host publication | Conference on Lasers and Electro-Optics, CLEO 2010 |
State | Published - Dec 1 2010 |
Event | Conference on Lasers and Electro-Optics, CLEO 2010 - San Jose, CA, United States Duration: May 16 2010 → May 21 2010 |
Other
Other | Conference on Lasers and Electro-Optics, CLEO 2010 |
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Country/Territory | United States |
City | San Jose, CA |
Period | 5/16/10 → 5/21/10 |
All Science Journal Classification (ASJC) codes
- Instrumentation
- Atomic and Molecular Physics, and Optics