Detection of high mass cluster ions sputtered from Bi surfaces

A. Shepard; R. W. Hewitt; G. J. Slusser; W. E. Baitinger; R. G. Cooks; N. Winograd; W. N. Delgass; A. Varon; G. Devant

doi:10.1016/0009-2614(76)80533-7

Detection of high mass cluster ions sputtered from Bi surfaces

A. Shepard
, R. W. Hewitt
, G. J. Slusser
, W. E. Baitinger
, R. G. Cooks
, N. Winograd
, W. N. Delgass
, A. Varon
, G. Devant

Chemistry

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

The technique of secondary ion mass spectrometry (SIMS) has been employed to detect Bi⁺₃ ions and associated oxides Bi₃O⁺_x (x ≈ 1 to 4) from a Bi foil. Using a 3 keV Ar⁺ ion primary beam of 5 × 10^-7 A/cm², mass resolution to nearly 700 with the requisite sensitivity has been achieved. The Bi surface was also monitored by X-ray photoelectron spectroscopy (XPS or ESCA). The presence of a weak O 1s peak at 532.7 eV and a strong SIMS Bi⁺₃ peak is interpreted to mean that the oxygen is weakly incorporated into the Bi lattice without disrupting metalmetal bonds.

Original language	English (US)
Pages (from-to)	371-373
Number of pages	3
Journal	Chemical Physics Letters
Volume	44
Issue number	2
DOIs	https://doi.org/10.1016/0009-2614(76)80533-7
State	Published - Dec 1 1976

All Science Journal Classification (ASJC) codes

General Physics and Astronomy
Physical and Theoretical Chemistry

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10.1016/0009-2614(76)80533-7

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@article{ad8fc80abade4de990587e72940ebe07,

title = "Detection of high mass cluster ions sputtered from Bi surfaces",

abstract = "The technique of secondary ion mass spectrometry (SIMS) has been employed to detect Bi+3 ions and associated oxides Bi3O+x (x ≈ 1 to 4) from a Bi foil. Using a 3 keV Ar+ ion primary beam of 5 × 10-7 A/cm2, mass resolution to nearly 700 with the requisite sensitivity has been achieved. The Bi surface was also monitored by X-ray photoelectron spectroscopy (XPS or ESCA). The presence of a weak O 1s peak at 532.7 eV and a strong SIMS Bi+3 peak is interpreted to mean that the oxygen is weakly incorporated into the Bi lattice without disrupting metalmetal bonds.",

author = "A. Shepard and Hewitt, \{R. W.\} and Slusser, \{G. J.\} and Baitinger, \{W. E.\} and Cooks, \{R. G.\} and N. Winograd and Delgass, \{W. N.\} and A. Varon and G. Devant",

note = "Funding Information: The authorsw ish to thank the National Science Foundation (Grant No. MPS 759308) and the Air Force Office of Scientific Research( Grant No. AF762974) for financial assistanceO. ne of us (N-W.) also thankst he Alfred P. Sloan Foundation for a Fei-lowship.",

year = "1976",

month = dec,

day = "1",

doi = "10.1016/0009-2614(76)80533-7",

language = "English (US)",

volume = "44",

pages = "371--373",

journal = "Chemical Physics Letters",

issn = "0009-2614",

publisher = "Elsevier B.V.",

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}

TY - JOUR

T1 - Detection of high mass cluster ions sputtered from Bi surfaces

AU - Shepard, A.

AU - Hewitt, R. W.

AU - Slusser, G. J.

AU - Baitinger, W. E.

AU - Cooks, R. G.

AU - Winograd, N.

AU - Delgass, W. N.

AU - Varon, A.

AU - Devant, G.

N1 - Funding Information: The authorsw ish to thank the National Science Foundation (Grant No. MPS 759308) and the Air Force Office of Scientific Research( Grant No. AF762974) for financial assistanceO. ne of us (N-W.) also thankst he Alfred P. Sloan Foundation for a Fei-lowship.

PY - 1976/12/1

Y1 - 1976/12/1

N2 - The technique of secondary ion mass spectrometry (SIMS) has been employed to detect Bi+3 ions and associated oxides Bi3O+x (x ≈ 1 to 4) from a Bi foil. Using a 3 keV Ar+ ion primary beam of 5 × 10-7 A/cm2, mass resolution to nearly 700 with the requisite sensitivity has been achieved. The Bi surface was also monitored by X-ray photoelectron spectroscopy (XPS or ESCA). The presence of a weak O 1s peak at 532.7 eV and a strong SIMS Bi+3 peak is interpreted to mean that the oxygen is weakly incorporated into the Bi lattice without disrupting metalmetal bonds.

AB - The technique of secondary ion mass spectrometry (SIMS) has been employed to detect Bi+3 ions and associated oxides Bi3O+x (x ≈ 1 to 4) from a Bi foil. Using a 3 keV Ar+ ion primary beam of 5 × 10-7 A/cm2, mass resolution to nearly 700 with the requisite sensitivity has been achieved. The Bi surface was also monitored by X-ray photoelectron spectroscopy (XPS or ESCA). The presence of a weak O 1s peak at 532.7 eV and a strong SIMS Bi+3 peak is interpreted to mean that the oxygen is weakly incorporated into the Bi lattice without disrupting metalmetal bonds.

UR - https://www.scopus.com/pages/publications/0346398982

UR - https://www.scopus.com/pages/publications/0346398982#tab=citedBy

U2 - 10.1016/0009-2614(76)80533-7

DO - 10.1016/0009-2614(76)80533-7

M3 - Article

AN - SCOPUS:0346398982

SN - 0009-2614

VL - 44

SP - 371

EP - 373

JO - Chemical Physics Letters

JF - Chemical Physics Letters

IS - 2

ER -

Detection of high mass cluster ions sputtered from Bi surfaces

Abstract

All Science Journal Classification (ASJC) codes

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