Detection of LO mode in v-SiO2 by infrared diffuse reflectance spectroscopy

Rui M. Almeida; Theresa A. Guiton; Carlo G. Pantano

doi:10.1016/0022-3093(90)90847-F

Detection of LO mode in v-SiO₂ by infrared diffuse reflectance spectroscopy

Rui M. Almeida, Theresa A. Guiton, Carlo G. Pantano

Research output: Contribution to journal › Letter › peer-review

40 Scopus citations

Abstract

It has been found that the high frequency longitudinal optical (LO) mode in vitreous SiO₂ can be observed in the diffuse reflectance spectra of bulk glass or powder compacts. The sensitivity to this mode arises because of the off-normal components of reflectance which are collected in the diffuse reflectance spectra. The frequency and intensity of the mode are only approximately determined, however, and Kramers-Kronig transformation of specular reflectivity data is required to calculate precisely the mode location and intensity. The significance of this finding is that, in contrast to the use of infrared reflectance or Raman spectroscopy, where polished bulk specimens or single crystals are required, the present approach permits the determination of LO modes with with powder.

Original language	English (US)
Pages (from-to)	238-241
Number of pages	4
Journal	Journal of Non-Crystalline Solids
Volume	119
Issue number	2
DOIs	https://doi.org/10.1016/0022-3093(90)90847-F
State	Published - Apr 2 1990

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Ceramics and Composites
Condensed Matter Physics
Materials Chemistry

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10.1016/0022-3093(90)90847-F

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@article{c5029b0e511a4344a64e96782c48e322,

title = "Detection of LO mode in v-SiO2 by infrared diffuse reflectance spectroscopy",

abstract = "It has been found that the high frequency longitudinal optical (LO) mode in vitreous SiO2 can be observed in the diffuse reflectance spectra of bulk glass or powder compacts. The sensitivity to this mode arises because of the off-normal components of reflectance which are collected in the diffuse reflectance spectra. The frequency and intensity of the mode are only approximately determined, however, and Kramers-Kronig transformation of specular reflectivity data is required to calculate precisely the mode location and intensity. The significance of this finding is that, in contrast to the use of infrared reflectance or Raman spectroscopy, where polished bulk specimens or single crystals are required, the present approach permits the determination of LO modes with with powder.",

author = "Almeida, {Rui M.} and Guiton, {Theresa A.} and Pantano, {Carlo G.}",

note = "Funding Information: One of the.' authors (R.M.A.) wishes to acknowledge the financial support of the Junta Nacional de Investiga~o Cientifica e Tecnol6gica and the Funda~o Luso-Americana para o De-senvolvimento (Portugal) plus the National Academy of Sciences (USA), for their joint support of this work. The support of INESC (Portugal) is also acknowledgedT. .A.G. and C.G.P. thank the Office of Naval Research (N00014-86-K) for their support of this work.",

year = "1990",

month = apr,

day = "2",

doi = "10.1016/0022-3093(90)90847-F",

language = "English (US)",

volume = "119",

pages = "238--241",

journal = "Journal of Non-Crystalline Solids",

issn = "0022-3093",

publisher = "Elsevier B.V.",

number = "2",

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TY - JOUR

T1 - Detection of LO mode in v-SiO2 by infrared diffuse reflectance spectroscopy

AU - Almeida, Rui M.

AU - Guiton, Theresa A.

AU - Pantano, Carlo G.

N1 - Funding Information: One of the.' authors (R.M.A.) wishes to acknowledge the financial support of the Junta Nacional de Investiga~o Cientifica e Tecnol6gica and the Funda~o Luso-Americana para o De-senvolvimento (Portugal) plus the National Academy of Sciences (USA), for their joint support of this work. The support of INESC (Portugal) is also acknowledgedT. .A.G. and C.G.P. thank the Office of Naval Research (N00014-86-K) for their support of this work.

PY - 1990/4/2

Y1 - 1990/4/2

N2 - It has been found that the high frequency longitudinal optical (LO) mode in vitreous SiO2 can be observed in the diffuse reflectance spectra of bulk glass or powder compacts. The sensitivity to this mode arises because of the off-normal components of reflectance which are collected in the diffuse reflectance spectra. The frequency and intensity of the mode are only approximately determined, however, and Kramers-Kronig transformation of specular reflectivity data is required to calculate precisely the mode location and intensity. The significance of this finding is that, in contrast to the use of infrared reflectance or Raman spectroscopy, where polished bulk specimens or single crystals are required, the present approach permits the determination of LO modes with with powder.

AB - It has been found that the high frequency longitudinal optical (LO) mode in vitreous SiO2 can be observed in the diffuse reflectance spectra of bulk glass or powder compacts. The sensitivity to this mode arises because of the off-normal components of reflectance which are collected in the diffuse reflectance spectra. The frequency and intensity of the mode are only approximately determined, however, and Kramers-Kronig transformation of specular reflectivity data is required to calculate precisely the mode location and intensity. The significance of this finding is that, in contrast to the use of infrared reflectance or Raman spectroscopy, where polished bulk specimens or single crystals are required, the present approach permits the determination of LO modes with with powder.

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U2 - 10.1016/0022-3093(90)90847-F

DO - 10.1016/0022-3093(90)90847-F

M3 - Letter

AN - SCOPUS:0025413859

SN - 0022-3093

VL - 119

SP - 238

EP - 241

JO - Journal of Non-Crystalline Solids

JF - Journal of Non-Crystalline Solids

IS - 2

ER -

Detection of LO mode in v-SiO₂ by infrared diffuse reflectance spectroscopy

Abstract

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