Detection of neutral atoms sputtered from ion-bombarded single-crystalsurfaces Rh{111} and p{2X2) O/Rh{111}: Ejection mechanism and surface structure determinations from energy-and angle-resolved measurements

J. Singh; C. T. Reimann; J. P. Baxter; G. A. Schick; P. H. Kobrin; B. J. Garrison; N. Winograd

doi:10.1116/1.574637

Detection of neutral atoms sputtered from ion-bombarded single-crystalsurfaces Rh{111} and p{2X2) O/Rh{111}: Ejection mechanism and surface structure determinations from energy-and angle-resolved measurements

J. Singh, C. T. Reimann, J. P. Baxter, G. A. Schick, P. H. Kobrin, B. J. Garrison, N. Winograd

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1191-1193
Number of pages	3
Journal	Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume	5
Issue number	4
DOIs	https://doi.org/10.1116/1.574637
State	Published - Jul 1 1987

All Science Journal Classification (ASJC) codes

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films

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Singh, J., Reimann, C. T., Baxter, J. P., Schick, G. A., Kobrin, P. H., Garrison, B. J., & Winograd, N. (1987). Detection of neutral atoms sputtered from ion-bombarded single-crystalsurfaces Rh{111} and p{2X2) O/Rh{111}: Ejection mechanism and surface structure determinations from energy-and angle-resolved measurements. Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, 5(4), 1191-1193. https://doi.org/10.1116/1.574637

Singh, J. ; Reimann, C. T. ; Baxter, J. P. et al. / Detection of neutral atoms sputtered from ion-bombarded single-crystalsurfaces Rh{111} and p{2X2) O/Rh{111} : Ejection mechanism and surface structure determinations from energy-and angle-resolved measurements. In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 1987 ; Vol. 5, No. 4. pp. 1191-1193.

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title = "Detection of neutral atoms sputtered from ion-bombarded single-crystalsurfaces Rh{111} and p{2X2) O/Rh{111}: Ejection mechanism and surface structure determinations from energy-and angle-resolved measurements",

author = "J. Singh and Reimann, {C. T.} and Baxter, {J. P.} and Schick, {G. A.} and Kobrin, {P. H.} and Garrison, {B. J.} and N. Winograd",

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language = "English (US)",

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Singh, J, Reimann, CT, Baxter, JP, Schick, GA, Kobrin, PH, Garrison, BJ & Winograd, N 1987, 'Detection of neutral atoms sputtered from ion-bombarded single-crystalsurfaces Rh{111} and p{2X2) O/Rh{111}: Ejection mechanism and surface structure determinations from energy-and angle-resolved measurements', Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, vol. 5, no. 4, pp. 1191-1193. https://doi.org/10.1116/1.574637

Detection of neutral atoms sputtered from ion-bombarded single-crystalsurfaces Rh{111} and p{2X2) O/Rh{111}: Ejection mechanism and surface structure determinations from energy-and angle-resolved measurements. / Singh, J.; Reimann, C. T.; Baxter, J. P. et al.
In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 5, No. 4, 01.07.1987, p. 1191-1193.

Research output: Contribution to journal › Article › peer-review

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T1 - Detection of neutral atoms sputtered from ion-bombarded single-crystalsurfaces Rh{111} and p{2X2) O/Rh{111}

T2 - Ejection mechanism and surface structure determinations from energy-and angle-resolved measurements

AU - Singh, J.

AU - Reimann, C. T.

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AU - Schick, G. A.

AU - Kobrin, P. H.

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AU - Winograd, N.

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Singh J, Reimann CT, Baxter JP, Schick GA, Kobrin PH, Garrison BJ et al. Detection of neutral atoms sputtered from ion-bombarded single-crystalsurfaces Rh{111} and p{2X2) O/Rh{111}: Ejection mechanism and surface structure determinations from energy-and angle-resolved measurements. Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 1987 Jul 1;5(4):1191-1193. doi: 10.1116/1.574637

Detection of neutral atoms sputtered from ion-bombarded single-crystalsurfaces Rh{111} and p{2X2) O/Rh{111}: Ejection mechanism and surface structure determinations from energy-and angle-resolved measurements

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