Detection of orientation-dependent, single-crystal diamond tool edge wear using cutting force sensors, while spin-turning silicon

Eric Russell Marsh; George A. Kim; James A. Simonson

Detection of orientation-dependent, single-crystal diamond tool edge wear using cutting force sensors, while spin-turning silicon

Eric Russell Marsh, George A. Kim, James A. Simonson

Mechanical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE
State	Published - Dec 1 2008
Event	23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE - Portland, OR, United States Duration: Oct 19 2008 → Oct 24 2008

Publication series

Name	Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE

Other

Other	23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE
Country/Territory	United States
City	Portland, OR
Period	10/19/08 → 10/24/08

All Science Journal Classification (ASJC) codes

Mechanical Engineering

Cite this

Marsh, E. R., Kim, G. A., & Simonson, J. A. (2008). Detection of orientation-dependent, single-crystal diamond tool edge wear using cutting force sensors, while spin-turning silicon. In Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE (Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE).

Marsh, Eric Russell ; Kim, George A. ; Simonson, James A. / Detection of orientation-dependent, single-crystal diamond tool edge wear using cutting force sensors, while spin-turning silicon. Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE. 2008. (Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE).

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title = "Detection of orientation-dependent, single-crystal diamond tool edge wear using cutting force sensors, while spin-turning silicon",

author = "Marsh, {Eric Russell} and Kim, {George A.} and Simonson, {James A.}",

year = "2008",

month = dec,

day = "1",

language = "English (US)",

isbn = "9781887706483",

series = "Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE",

booktitle = "Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE",

note = "23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE ; Conference date: 19-10-2008 Through 24-10-2008",

}

Marsh, ER, Kim, GA & Simonson, JA 2008, Detection of orientation-dependent, single-crystal diamond tool edge wear using cutting force sensors, while spin-turning silicon. in Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE. Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE, 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE, Portland, OR, United States, 10/19/08.

Detection of orientation-dependent, single-crystal diamond tool edge wear using cutting force sensors, while spin-turning silicon. / Marsh, Eric Russell; Kim, George A.; Simonson, James A.
Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE. 2008. (Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Detection of orientation-dependent, single-crystal diamond tool edge wear using cutting force sensors, while spin-turning silicon

AU - Marsh, Eric Russell

AU - Kim, George A.

AU - Simonson, James A.

PY - 2008/12/1

Y1 - 2008/12/1

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M3 - Conference contribution

AN - SCOPUS:84884952688

SN - 9781887706483

T3 - Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE

BT - Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE

T2 - 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE

Y2 - 19 October 2008 through 24 October 2008

ER -

Marsh ER, Kim GA, Simonson JA. Detection of orientation-dependent, single-crystal diamond tool edge wear using cutting force sensors, while spin-turning silicon. In Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE. 2008. (Proceedings of the 23rd Annual Meeting of the American Society for Precision Engineering, ASPE 2008 and the 12th ICPE).

Detection of orientation-dependent, single-crystal diamond tool edge wear using cutting force sensors, while spin-turning silicon

Publication series

Other

All Science Journal Classification (ASJC) codes

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Cite this