Skip to main navigation Skip to search Skip to main content

Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-Å information limit

  • C. Kisielowski
  • , B. Freitag
  • , M. Bischoff
  • , H. Van Lin
  • , S. Lazar
  • , G. Knippels
  • , P. Tiemeijer
  • , M. Van Der Stam
  • , S. Von Harrach
  • , M. Stekelenburg
  • , M. Haider
  • , S. Uhlemann
  • , H. Müller
  • , P. Hartel
  • , B. Kabius
  • , D. Miller
  • , I. Petrov
  • , E. A. Olson
  • , T. Donchev
  • , E. A. Kenik
    • A. R. Lupini, J. Bentley, S. J. Pennycook, I. M. Anderson, A. M. Minor, A. K. Schmid, T. Duden, V. Radmilovic, Q. M. Ramasse, M. Watanabe, R. Erni, E. A. Stach, P. Denes, U. Dahmen

Research output: Contribution to journal › Article › peer-review

287   Link opens in a new tab Scopus citations

Fingerprint

Dive into the research topics of 'Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-Å information limit'. Together they form a unique fingerprint.
Sort by

Keyphrases

Material Science

Physics

Chemistry