TY - JOUR
T1 - Determination of constitutive and morphological parameters of columnar thin films by inverse homogenization
AU - MacKay, Tom G.
AU - Lakhtakia, Akhlesh
N1 - Funding Information:
TGM is supported by a Royal Academy of Engineering/Leverhulme Trust Senior Research Fellowship. AL thanks the Binder Endowment at Penn State for partial financial support of his research activities. On the occasion of his 70th birthday, the authors felicitate Prof. Craig F. Bohren (Pennsylvania State University) for distinguished contributions to the optical response characteristics of particles as well as for providing our research community with a bevy of very useful and humorous books [45–49].
PY - 2010
Y1 - 2010
N2 - A dielectric columnar thin film (CTF), characterized macroscopically by a relative permittivity dyadic, was investigated theoretically. The CTF was assumed, on the nanoscale, to be an assembly of parallel, identical, elongated ellipsoidal inclusions made of an isotropic dielectric material that has a different refractive index from the bulk material that was evaporated to fabricate the CTF. The inverse Bruggeman homogenization formalism was developed in order to estimate the refractive index of the deposited material, one of the two shape factors of the ellipsoidal inclusions, and the volume fraction occupied by the deposited material, from a knowledge of relative permittivity dyadic of the CTF. A modified Newton-Raphson technique was implemented to solve the inverse Bruggeman equations. Numerical studies revealed how the three nanoscale parameters of CTFs vary as functions of the vapor incidence angle.
AB - A dielectric columnar thin film (CTF), characterized macroscopically by a relative permittivity dyadic, was investigated theoretically. The CTF was assumed, on the nanoscale, to be an assembly of parallel, identical, elongated ellipsoidal inclusions made of an isotropic dielectric material that has a different refractive index from the bulk material that was evaporated to fabricate the CTF. The inverse Bruggeman homogenization formalism was developed in order to estimate the refractive index of the deposited material, one of the two shape factors of the ellipsoidal inclusions, and the volume fraction occupied by the deposited material, from a knowledge of relative permittivity dyadic of the CTF. A modified Newton-Raphson technique was implemented to solve the inverse Bruggeman equations. Numerical studies revealed how the three nanoscale parameters of CTFs vary as functions of the vapor incidence angle.
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U2 - 10.1117/1.3332584
DO - 10.1117/1.3332584
M3 - Article
AN - SCOPUS:80455150211
SN - 1934-2608
VL - 4
JO - Journal of Nanophotonics
JF - Journal of Nanophotonics
IS - 1
M1 - 041535
ER -